About
Automotive IC applications have always played an important role in the field of IC testing. Thermal control accuracy and range are driving us to develop our work more and more precisely. IC test handling platforms are also widely requested to decrease our footprint and consumed parts.

Explore how Chroma deals with IC test requirements by developing our own technologies. Furthermore, we will also share the challenges currently faced and how we seek to overcome them in the near future.

You will learn:
1. Liquid-less thermal control unit and how its design concept supports wide temperature range and accuracy
2. CRF solutions for the high contact force demand from bigger DUTs
3. Dual force ideas to deal with bare die packages, such as CoWoS and InFO
4. Handler compatible for both FT and SLT
5. Roadmap of future product development
Presenters
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James Billington
Editor - Electric and Hybrid Vehicle Technology Magazine
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Marc Yeh
Sales Manager - Chroma ATE Inc.
1. Experienced in integrated system solutions for IC test handling, thermal control, and AOI inspection.
2. Wide customer industry supporting: automotive, 5G, aerospace, IOT, data centre, and AI.
3. Responsible for overseas sales to worldwide customers across the US, Europe, North and South East Asia.
4. Proficient in English, French, Japanese, and Mandarin for optimal sales and technical service.
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