About
Thermo Fisher Scientific proudly introduces the Thermo Scientific™ Iliad™ (Scanning) Transmission Electron Microscope. Exceeding the highest standards in imaging, this platform offers a fully integrated, advanced analytical solution with electron energy-loss spectroscopy (EELS) and energy-dispersive X-ray spectroscopy (EDX).

Featuring Thermo Scientific™ Velox™ and AutoScript™ software at the helm, the system leverages a new Iliad EELS Spectrometer, Zebra EELS Detector, the NanoPulser electrostatic beam blanker, several EDX detector options, and an operating voltage ranging from 30 to 300 kV to conduct ground-breaking analyses.

The unprecedented hardware and software integration of the Iliad (S)TEM, along with our future-proof approach to instrument design, accelerates research at the frontiers of modern materials science.

In this webinar, we explore the power of fully integrated multimodal analysis with the Iliad (S)TEM, enabling advanced characterization of highly complex and challenging modern materials.

By attending this webinar, you will learn:

- The power of multimodal hardware and software integration in (S)TEM
- How the Iliad (S)TEM is expanding the horizons of modern EELS analysis
- How the NanoPulser expands temporal beam control and dose optimization
- The unprecedented data quality, efficiency, and ease-of-use that the Iliad (S)TEM platform offers for opening new doors in scientific discovery
Presenters
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Lee Casalena, PhD
Sr. TEM Product & Applications Scientist – Thermo Fisher Scientific, Inc.
Dr. Lee Casalena is a senior technical product specialist for materials science TEM at Thermo Fisher Scientific. Lee brings a rich background in microscopy and materials characterization experience, including five years as a TEM Field Applications Scientist.

Prior to joining Thermo Fisher, then FEI, Lee completed his PhD in Materials Science & Engineering under Prof. Mike Mills at The Ohio State University. His graduate research focused on thermo-mechanical effects of multi-element additions to advanced shape memory alloy systems, with a focus on structural and chemical characterization of novel secondary phase formations using TEM. He has contributed to multiple publications on these topics and received awards for his research including a presidential fellowship. He is based out of Portland, Oregon.
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C. Austin Wade, PhD
Sr. TEM Product & Applications Scientist – Thermo Fisher Scientific, Inc.
Dr. Austin Wade received his B.S and Ph.D. in Materials Science and Engineering from Lehigh University where he studied under Prof. Masashi Watanabe. He then joined FEI (now Thermo Fisher Scientific) as a post-doctoral research fellow at the University of Manchester, England.

Upon returning to the USA Austin worked as a staff scientist in the Americas NanoPort where he demonstrated transmission electron microscopes to potential customers and provided post-sales support and training. He is currently a senior product specialist for materials science transmission electron microscopy.
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