Almost all modern circuits are sensitive to power quality, which to a large extent is a measurement of the power rail impedance. This is because flat impedance power rails result in much lower noise than power rails that aren’t flat. In RF circuits the peaks generally result in increased phase noise, while in digital circuits the issues are related to the allowed voltage window for the ASIC’s. In high-speed transceivers, these peaks result in jitter, which is also related to phase noise. In analog circuits, the peaks can result in increased noise density and in analog to digital converters the peaks result in spurious responses. The power rail impedance is typically controlled by the careful selection of bulk aluminum or tantalum capacitors, ceramic decoupling capacitors, inductors, and ferrite beads.
The instrument of choice for these impedance measurements is a vector network analyzer and the most common and highest accuracy measurement is the 2-port shunt through technique, using a 2-port VNA. The VNA offers the excellent dynamic range and also wide bandwidth. Unfortunately, the measurement includes a low-frequency ground loop that needs to be isolated.
When?
Tuesday, January 22, 2019 · 11:00 a.m.
Indiana (East)
Duration: 1 hour
Price
Free
Language
English
Who can attend
Everyone
Webinar ID
e02528812392
Dial-in available? (listen only)
Yes.
Dial-in Number
Please register for this Webinar to view the dial-in info.
Agenda
Flat and non-flat impedance measurement
Differences between 1-port and 2-port impedance measurements
Reason for the low-frequency ground loop and how to resolve it
Using a VNA to extract S-parameter files for inductors and capacitors
Steve Sandler has been involved with power system engineering for nearly 40 years. The founder and CEO of Picotest.com, a company specializing in instruments and accessories for high-performance power system and distributed system testing, Steve...
Brian Walker is the Senior RF Engineer at Copper Mountain Technologies where he helps customers to resolve technical issues and works to develop new solutions for applications of VNAs in test and measurement. Previously, he was the Manager of RF...