About
Cross-sectioning with the Leica EM TXP is performed to prepare industry samples for imaging and chemical analysis with Laser-Induced Breakdown Spectroscopy. This integrated workflow allows for pinpointing and easy preparation of barely visible targets in a few minutes.

Join us for our demo session and gain insights into handling challenging samples and getting quality images and analysis results with minimum effort.

Benefits:

1) Fast and targeted x-section material samples
2) Create precise and reproducible images and data
3) Enhance work efficiency by 90% with 2-in-1 Visual & Chemical Material Inspection
Agenda
  • 2:00 p.m. - 2:30 p.m. Introduction to Sample Preparation Solutions - Angela Hu, Leica Microsystems
  • 2:30 p.m. - 3:00 p.m. Introduction to High Quality Imaging Solutions - Veronique Teo, Leica Microsystems
  • 3:00 p.m. - 3:10 p.m. Question & Answer Session
Presenters
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Angela Hu
Regional Application Specialist in Leica Microsystems SEA
Angela has more than 20 years of working experience in nanotechnology, which covers sample preparation and sample analysis with several types of analytical instruments such as light microscopes, SEM, TEM and so on.
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Veronique Teo
Senior Applications Specialist, Leica Microsystems (SEA) Pte Ltd
Veronique is a Senior Application Specialist for Leica Microsystems, SEA, and Taiwan with many years of imaging experience, taking care of local and regional sales support and distributors support and training.
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