About
Scanning Electron Microscope (SEM) is used to examine surface morphology in biological and material applications that demand the preservation of a specimen's surface details. Chemical processing is important to stabilize the structures, followed by critical point drying for drying samples for SEM applications.
To allow for sample imaging, non-conductive samples must be coated after drying. Adding a conductive coating of metal or carbon to the sample prevents charging, lowers heat damage, and improves the secondary electron signal needed for topography study. In addition to surface analysis, a comprehensive study of the sample using array tomography will allow the user to obtain a complete picture of the sample in a non-destructive fashion. This webinar goes into detail regarding sample preparation for topography and array tomography.
WEBINAR ENDED
Agenda
  • Sample preparation workflow for topographical study with automated CPD and coater
  • Introduction to sample preparation for array tomography
  • Use of modern digital ultramicrotome in array tomography for optimal results
Presenters
1594709881-1bec44acc51a715c
Leica Microsystems
1726553153-26ca3b405806ec47
Dr Indu Barwal
Product and Application Manager (LNT), India
Indu Barwal earned her PhD in Biotechnology from TERI school of advanced studies. She later worked as senior research fellow at AIIMS, New Delhi.
After spending 1.5 years as an Assistant Professor, she joined Regional Centre for Biotechnology, Faridabad as an Application scientist at the Electron microscope facility, where she managed and performed electron microscopy for various labs utilizing both conventional and cryo-based methodologies.
She currently works as a Product and Application Manager at Leica Microsystems in India, where she is responsible for business and application support for EM sample preparation equipment in India and adjacent countries
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