Metallic Impurity Analysis in Ultra-Pure N-Methyl Pyrrolidone (NMP) with the NexION 5000 ICP-MS

Join us for an in-depth look at how the NexION 5000 multi-quadrupole ICP-MS revolutionizes the detection of metallic impurities in ultra-pure N-Methyl Pyrrolidone (NMP), a critical solvent for semiconductor fabrication. The NexION 5000 enables precise, interference-free analysis of trace elements, meeting the rigorous demands of the semiconductor industry. Learn how advanced innovations like reaction mode technology and enhanced signal-to-background ratios ensure unparalleled sensitivity and accuracy for your quality control needs.