Using high energies for Macromolecular X-ray Crystallography (MX) brings many potential benefits, such as reduced damage to samples and more efficient data collection. However, this technique requires a suitable detector.
In this webinar, Dr. Selina Storm, a serial crystallography beamline scientist on I24 at Diamond Light Source (DLS), compared different detector sensors (Si and CdTe) based on the data they collected, talked about photoelectron escape in microcrystals at higher energies, and introduced other benefits of collecting MX data at high energies. Together with Dr. Andreas Förster, Application Scientist Crystallography at DECTRIS, Storm answered your questions about the CdTe sensors’ performance and the experimental setup.